Yield accelerating tools for advanced semiconductor manufacturing
As transistors continue to get smaller and grow in 3D complexity, leading-edge fabs need a new paradigm of metrology to improve yield
Yield Tools is developing the next paradigm of metrology tools that leading-edge fabs need to power the AI revolution
Will Schumaker founded Yield Tools to revolutionize semiconductor metrology for leading-edge semiconductor fabs. Previously, Will founded xLight, a light source company purpose-built for the future of semiconductor lithography. Prior to xLight, he designed and built the first laser-based soft X-ray (SXR) metrology tool at KLA. Earlier in his career, he led laser and X-ray research at Stanford University and the University of Michigan, where he holds a PhD in Nuclear Engineering.